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Explore the equipment represented in our inventory knowledge base, review technical metadata and discuss sourcing, selling or support requirements.
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KLA Archer 500 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA ARCHER A10XT has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA Archer Aim+ has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA Archer C700WT has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA Archer IO 5300 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA Archer XT+ has a recorded process classification of Photolithography in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA ASET F5 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA ASET-F5x has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 150mm, 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA AWUS 3110 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA Candela has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 150mm. Confirm the classification, configuration and condition against the system documentation.
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KLA Candela 6100 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA Candela 8520 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 150mm. Confirm the classification, configuration and condition against the system documentation.
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KLA Candela 8620 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 150mm, 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA Candela 8720 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA CANDELA CS1 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA CANDELA CS10 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 100mm. Confirm the classification, configuration and condition against the system documentation.
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KLA Candela CS20 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA CANDELA CS20r has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA Candela CS20V has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 150mm. Confirm the classification, configuration and condition against the system documentation.
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KLA CANDELA CS920 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 150mm. Confirm the classification, configuration and condition against the system documentation.
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KLA CD200 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA CI-T120 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA CI-T130 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA CI-T53P has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA CI-T830 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA CIRCLE 5 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA Compass 300 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA CRS 1010 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA CS2 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA DSW16E has a recorded process classification of Thin Film Deposition in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA ECD-1 has a recorded process classification of Inspection Equipment in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA eCD-2 has a recorded process classification of Inspection Equipment in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA eDR-5200 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA eDR-5210 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA eDR-7280 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA eDR-7380 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA eS-35 has a recorded process classification of Photolithography in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA eS31 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA ES32 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA ES810 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA EV300 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 150mm. Confirm the classification, configuration and condition against the system documentation.
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KLA F20-NIR has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA F5-SFX100 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA Film Measurement Tools has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA Flexus 5400 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA FlexUs Series has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA FLX 2320 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 150mm, 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA FLX 2320a has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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