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Explore the equipment represented in our inventory knowledge base, review technical metadata and discuss sourcing, selling or support requirements.
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KLA SP3 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA Spectra FX-1000 HT has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA Spectra-FX Single Wave Ellipsometer Kit has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA SpectraCD 200 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA SpectraCD-XT has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA SpectraCD-XTS+ has a recorded process classification of Thin Film Deposition in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA SpectraFilm 8660 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA SpectraFX 100 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA SpectraFX 200 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 150mm, 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA SpectraShape 11k has a recorded process classification of Thin Film Deposition in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA SpectraShape 8660 has a recorded process classification of Thin Film Deposition in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA SS9000 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA Starlight SL3 has a recorded process classification of Photolithography in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA Surfscan has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA Surfscan 4500 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 150mm. Confirm the classification, configuration and condition against the system documentation.
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KLA Surfscan 5500 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA Surfscan 6100 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA Surfscan 6200 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 150mm, 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA SurfScan 6220 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA SurfScan 6400 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 150mm, 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA Surfscan 6420 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA SurfScan 7600 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 150mm. Confirm the classification, configuration and condition against the system documentation.
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KLA Surfscan 7700 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA Surfscan 7700M has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA Surfscan SP1 TBI has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm, 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA Surfscan SP1 TBI Pro has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA Surfscan SP1-DLS has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm, 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA Surfscan SP2 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA Surfscan SP2 XP has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA Surfscan SP3 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA Surfscan SP5 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA Surfscan SP7 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA T830 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA Tencor F5 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA Tencor P-7 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA TeraStar SLF17 HR USRA has a recorded process classification of Photolithography in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA TeraStar SLF27 has a recorded process classification of Photolithography in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA TF-2 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA Thermawave TP420 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA TP630 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA TTV-benchtop has a recorded process classification of Inspection Equipment in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA USM100 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 150mm. Confirm the classification, configuration and condition against the system documentation.
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KLA UV 1050 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 150mm, 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA UV 1080 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA UV 1250 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA UV 1250-II has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA UV 1250SE has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA UV-1280 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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