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Explore the equipment represented in our inventory knowledge base, review technical metadata and discuss sourcing, selling or support requirements.
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KLA FLX 2908 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 150mm. Confirm the classification, configuration and condition against the system documentation.
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KLA FLX-5400 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA FLX-5500 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA FLX-5510 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA FT650 has a recorded process classification of Prober in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA FX5 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA HRP 220 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA HRP 340 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA HRP-240 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA ICOS6100-7.6 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA ILM-2139 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA INS 3300 has a recorded process classification of Photolithography in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA Inspex Eagle has a recorded process classification of Photolithography in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 150mm. Confirm the classification, configuration and condition against the system documentation.
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KLA IVC-1600 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA IVC-2000 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA IVC-4000 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA 1007 has a recorded process classification of Prober in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 150mm. Confirm the classification, configuration and condition against the system documentation.
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KLA 201 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 150mm, 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA 2122 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA 2128 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA 2131 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 150mm. Confirm the classification, configuration and condition against the system documentation.
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KLA 2132 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA 2133 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 150mm, 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA 2138 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA 2139 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA 230 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA 2350 has a recorded process classification of Inspection Equipment in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA 2351 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA 2367 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA 2552 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA 259 has a recorded process classification of Photolithography in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 150mm. Confirm the classification, configuration and condition against the system documentation.
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KLA 2820 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA 301 has a recorded process classification of Photolithography in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA 5100 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 150mm, 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA 6420 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 150mm, 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA 8100 has a recorded process classification of Inspection Equipment in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA Kronos 1190 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA M-GAGE 200 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 150mm. Confirm the classification, configuration and condition against the system documentation.
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KLA M-GAGE 300 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA NBLL has a recorded process classification of Support Equipment in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA OmniMap RS100 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 300mm. Confirm the classification, configuration and condition against the system documentation.
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KLA OmniMap RS55/TCA has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA OmniMap RS75 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA OmniMap RS75/TC has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA OmniMap RS75/TCA has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA OP-5240 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Confirm the classification, configuration and condition against the system documentation.
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KLA Opti-Probe 5340 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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KLA P-10 has a recorded process classification of Metrology in Lync Semi's inventory knowledge snapshot. Recorded wafer formats: 200mm. Confirm the classification, configuration and condition against the system documentation.
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